At Patents you can conduct a Patent Search, File a Patent Application, find a Patent Attorney, or search available technology through our Patent Exchange. Patents are available using simple keyword or date criteria. If you are looking to hire a patent attorney, you've come to the right place. Protect your idea and hire a patent lawyer. A method includes obtaining first volumetric image data, which is acquired at a first time, including a region of interest with a structural feature located at a first position. The method further includes obtaining second volumetric image data, which is acquired at a second different time, including the region of interest with the structural feature located at a second different position. The method further includes determining a registration transformation that registers the first and second volumetric image data such that the at least one structural feature in the first volumetric image data aligns with the at least one structural feature in the second volumetric image data. The registration transformation is based at least on a contour guided deformation registration. The method further includes generating a signal indicative of the registration transformation. Source.